COMPARISON OF CHARGE-DENSITIES AND PSEUDO CHARGE-DENSITIES FOR SI2

被引:20
作者
MILLER, DJ [1 ]
HANEMAN, D [1 ]
BAERENDS, EJ [1 ]
ROS, P [1 ]
机构
[1] FREE UNIV AMSTERDAM,SCHEIKUNDIG LAB,AMSTERDAM,NETHERLANDS
关键词
D O I
10.1103/PhysRevLett.41.197
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:197 / 200
页数:4
相关论文
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