AUTOMATIC DENSITOMETER MEASUREMENTS OF POWDER DIFFRACTION PHOTOGRAPHS

被引：76

作者：

MALMROS, G ^{[1
]}

WERNER, PE ^{[1
]}

机构：

[1] UNIV STOCKHOLM,INST INORG & PHYS CHEM,STOCKHOLM 10405,SWEDEN

来源：

ACTA CHEMICA SCANDINAVICA | 1973年 / 27卷 / 02期

关键词：

D O I：

10.3891/acta.chem.scand.27-0493

中图分类号：

Q5 [生物化学]; Q7 [分子生物学];

学科分类号：

071010 ; 081704 ;

摘要：

引用

页码：493 / 502

页数：10

共 15 条

[1] A COMPUTER CONTROLLED FILM SCANNER
ABRAHAMSSON, S
[J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1966, 43 (12): : 931 - +
[2] ARNDT UW, 1966, SINGLE CRYSTAL DIFFR
[3] MEASUREMENT OF X-RAY POWDER DIFFRACTION FILMS WITH AUTOMATIC CORRECTION FOR SHRINKAGE
HAGG, G
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1947, 18 (05) : 371 - 372
[4] KLUG HP, 1954, XRAY DIFFRACTION PRO
[5] CRYSTAL STRUCTURE OF ALPHA-BI2O3
MALMROS, G
[J]. ACTA CHEMICA SCANDINAVICA, 1970, 24 (02): : 384 - &
[6] RESULTS OF THE IUCR PRECISION LATTICE-PARAMETER PROJECT
PARRISH, W
[J]. ACTA CRYSTALLOGRAPHICA, 1960, 13 (10): : 838 - 850
[7] INTENSITY CORRECTIONS FOR GUINIER CAMERA
SAS, WH
DEWOLFF, PM
[J]. ACTA CRYSTALLOGRAPHICA, 1966, 21 : 826 - &
[8] SWANSON HE, 1963, NBS539 CIRC, V21, P37
[9] Werner P.-E., 1969, ARK KEMI, V31, P513
[10] CORRECTION OF SYSTEMATIC ERRORS IN DETERMINATION OF X-RAY DIFFRACTION INTENSITIES BY INTEGRATING MICRODENSITOMETERS
WERNER, PE
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1971, 4 (05): : 351 - &