PREDICTION OF THE BIDIRECTIONAL REFLECTANCE-DISTRIBUTION FUNCTION FROM ATOMIC-FORCE AND SCANNING-TUNNELING MICROSCOPE MEASUREMENTS OF INTERFACIAL ROUGHNESS

Computer codes that are based on Elson's theory for light scattering by interfacial roughness in multilayer coatings were used to predict the bidirectional reflectance-distribution function (BRDF) of several opaque coatings from surface-roughness profiles measured by either a scanning-tunneling microscope or an atomic-force microscope. The predictions usually agreed with measured BRDF values to within a factor of 2. The coatings consisted of single layers of Ag or Ni and dielectric stacks with up to three layers.