INTERFACIAL CHEMISTRY AND ADHESION - RECENT DEVELOPMENTS AND PROSPECTS

[31] DWIGHT DW, 1977, CHARACTERIZATION MET, V2, P313

[32] Fowkes F. M., 1977, J COLLOID SCI, V32, P469

[33] Fowkes F. M., 1977, COATINGS PLASTICS PR, V37, P605

[34] DONOR-ACCEPTOR INTERACTIONS AT INTERFACES [J]. JOURNAL OF ADHESION, 1972, 4 (02) : 155 - &

[35] USE OF AUGER AND X-RAY PHOTOELECTRON-SPECTROSCOPY TO STUDY LOCUS OF FAILURE OF STRUCTURAL ADHESIVE JOINTS [J]. JOURNAL OF APPLIED POLYMER SCIENCE, 1977, 21 (09) : 2375 - 2392

[36] Good R. J., 1978, Adhesion Measurement of Thin Films, Thick Films and Bulk Coatings, P18, DOI 10.1520/STP38621S

[37] COVALENTLY ATTACHED ORGANIC MONOLAYERS ON SEMICONDUCTOR SURFACES [J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1978, 100 (26) : 8050 - 8055

[38] Hansma P. K., 1977, PHYS REP, V30, P665

[39] FOURIER-TRANSFORM INFRARED SPECTROSCOPIC STUDY OF STRUCTURE OF SILANE COUPLING AGENT ON E-GLASS FIBER [J]. JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1978, 64 (03) : 565 - 576

[40] Ishida M., 1979, ORGANIC COATINGS PRE, V41, P526

[31] DWIGHT DW, 1977, CHARACTERIZATION MET, V2, P313

[32] Fowkes F. M., 1977, J COLLOID SCI, V32, P469

[33] Fowkes F. M., 1977, COATINGS PLASTICS PR, V37, P605

[34] DONOR-ACCEPTOR INTERACTIONS AT INTERFACES [J]. JOURNAL OF ADHESION, 1972, 4 (02) : 155 - &

[35] USE OF AUGER AND X-RAY PHOTOELECTRON-SPECTROSCOPY TO STUDY LOCUS OF FAILURE OF STRUCTURAL ADHESIVE JOINTS [J]. JOURNAL OF APPLIED POLYMER SCIENCE, 1977, 21 (09) : 2375 - 2392

[36] Good R. J., 1978, Adhesion Measurement of Thin Films, Thick Films and Bulk Coatings, P18, DOI 10.1520/STP38621S

[37] COVALENTLY ATTACHED ORGANIC MONOLAYERS ON SEMICONDUCTOR SURFACES [J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1978, 100 (26) : 8050 - 8055

[38] Hansma P. K., 1977, PHYS REP, V30, P665

[39] FOURIER-TRANSFORM INFRARED SPECTROSCOPIC STUDY OF STRUCTURE OF SILANE COUPLING AGENT ON E-GLASS FIBER [J]. JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1978, 64 (03) : 565 - 576

[40] Ishida M., 1979, ORGANIC COATINGS PRE, V41, P526