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3-DIMENSIONAL MONTE-CARLO CALCULATION BY A SUPERCOMPUTER
被引:21
作者
:
HASEGAWA, S
论文数:
0
引用数:
0
h-index:
0
机构:
NEC SCI INFORMAT SYST DEV CO LTD,TAKATSU KU,KAWASAKI 213,JAPAN
NEC SCI INFORMAT SYST DEV CO LTD,TAKATSU KU,KAWASAKI 213,JAPAN
HASEGAWA, S
[
1
]
IIDA, Y
论文数:
0
引用数:
0
h-index:
0
机构:
NEC SCI INFORMAT SYST DEV CO LTD,TAKATSU KU,KAWASAKI 213,JAPAN
NEC SCI INFORMAT SYST DEV CO LTD,TAKATSU KU,KAWASAKI 213,JAPAN
IIDA, Y
[
1
]
HIDAKA, T
论文数:
0
引用数:
0
h-index:
0
机构:
NEC SCI INFORMAT SYST DEV CO LTD,TAKATSU KU,KAWASAKI 213,JAPAN
NEC SCI INFORMAT SYST DEV CO LTD,TAKATSU KU,KAWASAKI 213,JAPAN
HIDAKA, T
[
1
]
机构
:
[1]
NEC SCI INFORMAT SYST DEV CO LTD,TAKATSU KU,KAWASAKI 213,JAPAN
来源
:
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
|
1987年
/ 5卷
/ 01期
关键词
:
D O I
:
10.1116/1.583848
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:142 / 145
页数:4
相关论文
共 4 条
[1]
AIZAKI N, 1979, JPN J APPL PHYS S18, V18, P319
[2]
VECTORIZED MONTE-CARLO CALCULATION FOR THE TRANSPORT OF IONS IN AMORPHOUS TARGETS
PETERSEN, WP
论文数:
0
引用数:
0
h-index:
0
PETERSEN, WP
FICHTNER, W
论文数:
0
引用数:
0
h-index:
0
FICHTNER, W
GROSSE, EH
论文数:
0
引用数:
0
h-index:
0
GROSSE, EH
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1983,
30
(09)
: 1011
-
1017
[3]
SIMULATION OF BACKSCATTERED ELECTRON SIGNALS FOR X-RAY MASK INSPECTION
ROSENFIELD, MG
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALIF BERKELEY,ELECTR RES LAB,BERKELEY,CA 94720
ROSENFIELD, MG
NEUREUTHER, AR
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALIF BERKELEY,ELECTR RES LAB,BERKELEY,CA 94720
NEUREUTHER, AR
VISWANATHAN, R
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALIF BERKELEY,ELECTR RES LAB,BERKELEY,CA 94720
VISWANATHAN, R
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1983,
1
(04):
: 1358
-
1363
[4]
SHIMIZU R, 1972, OPTIK, V36, P59
←
1
→
共 4 条
[1]
AIZAKI N, 1979, JPN J APPL PHYS S18, V18, P319
[2]
VECTORIZED MONTE-CARLO CALCULATION FOR THE TRANSPORT OF IONS IN AMORPHOUS TARGETS
PETERSEN, WP
论文数:
0
引用数:
0
h-index:
0
PETERSEN, WP
FICHTNER, W
论文数:
0
引用数:
0
h-index:
0
FICHTNER, W
GROSSE, EH
论文数:
0
引用数:
0
h-index:
0
GROSSE, EH
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1983,
30
(09)
: 1011
-
1017
[3]
SIMULATION OF BACKSCATTERED ELECTRON SIGNALS FOR X-RAY MASK INSPECTION
ROSENFIELD, MG
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALIF BERKELEY,ELECTR RES LAB,BERKELEY,CA 94720
ROSENFIELD, MG
NEUREUTHER, AR
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALIF BERKELEY,ELECTR RES LAB,BERKELEY,CA 94720
NEUREUTHER, AR
VISWANATHAN, R
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALIF BERKELEY,ELECTR RES LAB,BERKELEY,CA 94720
VISWANATHAN, R
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1983,
1
(04):
: 1358
-
1363
[4]
SHIMIZU R, 1972, OPTIK, V36, P59
←
1
→