STUDY OF STRAIN FIELD OF GROWN-IN DISLOCATIONS IN A SILICON X-RAY INTERFEROMETER

被引：12

作者：

CHRISTIANSEN, G

GERWARD, L

ANDERSEN, AL

机构：

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1971年 / 4卷 / OCT1期

关键词：

D O I：

10.1107/S0021889871007222

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：370 / +

页数：1

共 12 条

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MENTER, JW
PASHLEY, DW
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[2] MOIRE PATTERNS OF ATOMIC PLANES OBTAINED BY X-RAY INTERFEROMETRY
BONSE, U
HART, M
[J]. ZEITSCHRIFT FUR PHYSIK, 1966, 190 (04): : 455 - &
[3] AN X-RAY INTERFEROMETER
BONSE, U
HART, M
[J]. APPLIED PHYSICS LETTERS, 1965, 6 (08) : 155 - &
[4] PRINCIPLES AND DESIGN OF LAUE-CASE X-RAY INTERFEROMETERS
BONSE, U
HART, M
[J]. ZEITSCHRIFT FUR PHYSIK, 1965, 188 (02): : 154 - &
[5] BONSE U, 1969, XRAY OPTICS MICROANA, P1
[6] X-RAY INTERFEROMETRIC MEASUREMENTS OF FORWARD SCATTERING AMPLITUDE FOR LITHIUM FLUORIDE
CREAGH, DC
HART, M
[J]. PHYSICA STATUS SOLIDI, 1970, 37 (02): : 753 - &
[7] DISLOCATIONS IN THE DIAMOND LATTICE
HORNSTRA, J
[J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1958, 5 (1-2) : 129 - 141
[8] X-RAY MOIRE TOPOGRAPHY OF LATTICE DEFECTS IN QUARTZ
LANG, AR
[J]. NATURE, 1968, 220 (5168) : 652 - &
[9] LINDEGAARD A, 1965, REV SCI INSTRUM, V36, P1888
[10] LINDEGAARDANDER.A, 1968, REV SCI INSTRUM, V39, P774