Artifact-free near-field optical imaging by apertureless microscopy

被引:85
作者
Labardi, M
Patane, S
Allegrini, M
机构
[1] Univ Pisa, Ist Nazl Fis Mat, I-56127 Pisa, Italy
[2] Univ Messina, Ist Nazl Fis Mat, I-98166 Messina, Italy
[3] Univ Messina, Dipartimento Fis MTFA, I-98166 Messina, Italy
关键词
D O I
10.1063/1.127064
中图分类号
O59 [应用物理学];
学科分类号
摘要
A method for optical near field discrimination, leading to drastic artifact reduction in superresolved imaging by scanning interference apertureless microscopy is presented. The method relies on second harmonic detection of the modulated optical signal scattered by a vibrating silicon tip. An edge resolution of 15 nm, or 7 nm Rayleigh-type resolution, with optical contrast as high as 50%, has been obtained on aluminum projection pattern samples in the constant gap width mode. Our method has been determined not to be affected by topographical artifacts by constant height mode scans. (C) 2000 American Institute of Physics. [S0003-6951(00)03431-8].
引用
收藏
页码:621 / 623
页数:3
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