EXAMINATION OF PERIPHERAL-NERVES WITH THE SCANNING ELECTRON-MICROSCOPE

被引：18

作者：

VANBEEK, AL

JACOBS, SC

ZOOK, EG

机构：

[1] Division of Plastic Surgery, Southern Illinois University School of Medicine, Springfield, IL

来源：

PLASTIC AND RECONSTRUCTIVE SURGERY | 1979年 / 63卷 / 04期

关键词：

D O I：

10.1097/00006534-197904000-00012

中图分类号：

R61 [外科手术学];

学科分类号：

摘要：

The theroretical apploications and advantages of the scanning microsope in peripheral nerve research are presented. The internal anatomy of the peripheral nerve can be distinctly examined, and long segments of axons can be examined without the necessity of tedious study of multiple sections. The SEM should make it possible to more readily study the migration of axon sprouts across a repair site. New concepts in teaching and research may develop from the use of this excellent tool. © 1979 American Society of Plastic Surgeons.

引用

页码：509 / 519

页数：11

共 33 条

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