STRUCTURAL DISORDER AND OPTICAL GAP FLUCTUATIONS IN AMORPHOUS-SILICON

被引:46
作者
SOKOLOV, AP
SHEBANIN, AP
GOLIKOVA, OA
MEZDROGINA, MM
机构
[1] NOVOSIBIRSK GEOL & GEOPHYS INST,NOVOSIBIRSK 630090,USSR
[2] AF IOFFE PHYSICOTECH INST,LENINGRAD 194021,USSR
关键词
D O I
10.1088/0953-8984/3/49/005
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Optical absorption and Raman spectra in a number of a-Si, a-Si:H and a-(Si:H):B samples have been investigated. It is shown that the optical gap changes are weakly correlated with the changes in TO peak width in Raman spectra but are well correlated with the changes in the TA peak intensity. The correlation between the amplitude of optical gap fluctuations, determined from the optical absorption spectra, and the TA peak intensity has been observed. These results suggest that the optical gap and the amplitude of its fluctuations in amorphous silicon and its alloys depend not only on bond-angle dispersion but also substantially on the degree of structural disorder on a scale of about 4-6 angstrom or greater.
引用
收藏
页码:9887 / 9894
页数:8
相关论文
共 21 条
[1]   COMPARATIVE-STUDY OF STRUCTURE OF EVAPORATED AND GLOW-DISCHARGE SILICON [J].
BARNA, A ;
BARNA, PB ;
RADNOCZI, G ;
TOTH, L ;
THOMAS, P .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1977, 41 (01) :81-84
[2]   NEUTRON-SCATTERING FROM LOW-FREQUENCY EXCITATIONS IN AMORPHOUS-GERMANIUM [J].
BUCHENAU, U ;
PRAGER, M ;
KAMITAKAHARA, WA ;
SHANKS, HR ;
NUCKER, N .
EUROPHYSICS LETTERS, 1988, 6 (08) :695-700
[3]   DISORDER AND THE OPTICAL-ABSORPTION EDGE OF HYDROGENATED AMORPHOUS-SILICON [J].
CODY, GD ;
TIEDJE, T ;
ABELES, B ;
BROOKS, B ;
GOLDSTEIN, Y .
PHYSICAL REVIEW LETTERS, 1981, 47 (20) :1480-1483
[4]  
GOLIKOVA OA, 1989, FIZ TEKH POLUPROV, V23, P1737
[5]  
JOANNOPOULOS JD, 1988, PHYSICS HYDROGENATED, pS448
[6]   VIBRATIONAL-SPECTRUM OF AMORPHOUS-SILICON - EXPERIMENT AND COMPUTER-SIMULATION [J].
KAMITAKAHARA, WA ;
SOUKOULIS, CM ;
SHANKS, HR ;
BUCHENAU, U ;
GREST, GS .
PHYSICAL REVIEW B, 1987, 36 (12) :6539-6542
[7]   DETERMINATION OF THE OPTICAL BANDGAP OF AMORPHOUS-SILICON [J].
KLAZES, RH ;
VANDENBROEK, MHLM ;
BEZEMER, J ;
RADELAAR, S .
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1982, 45 (04) :377-383
[8]   STRUCTURAL ORDER IN ANNEAL-STABLE AMORPHOUS-SILICON [J].
KSHIRSAGAR, ST ;
LANNIN, JS .
PHYSICAL REVIEW B, 1982, 25 (04) :2916-2919
[9]   CORRELATION OF RAMAN-SPECTRA WITH OPTICAL AND ELECTRONIC-PROPERTIES OF A-SI-H [J].
KUDOYAROVA, VK ;
KONKOV, OI ;
TERUKOV, EI ;
SOKOLOV, AP ;
SHEBANIN, AP .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1989, 114 :205-207
[10]  
LANNIN JS, 1982, PHYS REV B, V26, P3506, DOI 10.1103/PhysRevB.26.3506