SURFACE RESISTANCE OF SUPERCONDUCTING FILMS BY A MICROSTRIP RING RESONATOR TECHNIQUE

被引:2
作者
Andreone, A. [1 ,2 ]
DiChiara, A. [1 ,2 ]
Peluso, G. [1 ,2 ]
di Uccio, U. Scotti [1 ,2 ]
Attanasio, C. [3 ]
Maritato, I. [3 ]
Marra, S. [3 ]
Vaglio, R. [3 ]
Milani, E. [4 ]
Montuori, M. [4 ]
机构
[1] Univ Naples Federico II, Dipartimento Sci Fis, I-80125 Naples, Italy
[2] Ist Nazl Fis Nucl, Sez Napoli, I-80125 Naples, Italy
[3] Univ Salerno, Dipartimento Fis, I-84081 Salerno, Italy
[4] Univ Rome Tor Vergata, Dipartimento Ingn Meccan, I-00173 Rome, Italy
关键词
D O I
10.1109/77.233622
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A ring microstrip resonator technique has been set up to measure the surface impedance of superconducting films in the range 1-20 GHz as a function of temperature and both d.c. and r.f field amplitude. The method has been tested on Nb films and extended to both metallic compounds of interest for thin film coated accelerating cavity applications (NbTiN ) and high T-C oxide superconducting films of potential interest for microwave circuit applications such as high quality YBCO and BSCCC compounds, Including, in the last case, samples obtained by liquid phase epitaxy. The results confirm that losses at the grain boundaries or twinning planes play, an important role in determining the residual term and the high magnetic: field degradation of the surface resistance in both metallic and high T-C superconducting films.
引用
收藏
页码:1453 / 1456
页数:4
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