SIZE EFFECTS IN THIN-FILMS OF CADMIUM ARSENIDE

被引：4

作者：

ZDANOWICZ, L ^{[1
]}

POCZTOWSKI, G ^{[1
]}

ZDANOWICZ, W ^{[1
]}

机构：

[1] POLISH ACAD SCI,INST SOLID STATE PHYS,ZABRZE,POLAND

来源：

VACUUM | 1977年 / 27卷 / 04期

关键词：

D O I：

10.1016/0042-207X(77)90014-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：305 / 309

页数：5

共 15 条

[1] INFLUENCE OF STRUCTURE OF THIN ANTIMONY FILMS ON THEIR ELECTRICAL-CONDUCTIVITY [J].

ABOUELELA, AH ;

MAHMOUD, S .

APPLIED PHYSICS, 1975, 7 (01) :45-47

[2] The conductivity of thin metallic films according to the electron theory of metals [J].

Fuchs, K .

PROCEEDINGS OF THE CAMBRIDGE PHILOSOPHICAL SOCIETY, 1938, 34 :100-108

[3]

Many A, 1971, SEMICONDUCTOR SURFAC

[4] ELECTRICAL-RESISTIVITY MODEL FOR POLYCRYSTALLINE FILMS - CASE OF ARBITRARY REFLECTION AT EXTERNAL SURFACES [J].

MAYADAS, AF ;

SHATZKES, M .

PHYSICAL REVIEW B, 1970, 1 (04) :1382-&

[5]

Mola E. E., 1974, Electrocomponent Science and Technology, V1, P77, DOI 10.1155/APEC.1.77

[6] ELECTRICAL RESISTIVITY OF EVAPORATED THIN COBALT FILMS - APPROACH BASED ON MAYADAS-SHATZKES MODEL [J].

MOLA, EE ;

BORRAJO, J ;

HERAS, JM .

SURFACE SCIENCE, 1973, 34 (03) :561-570

[7]

ROSENMAN I, 1966, J PHYS SOC JPN, VS 21, P370

[8] THE MEAN FREE PATH OF ELECTRONS IN METALS [J].

SONDHEIMER, EH .

ADVANCES IN PHYSICS, 1952, 1 (01) :1-42

[9] THICKNESS DEPENDENCE OF ELECTRON MOBILITY OF INSB FILMS [J].

WIEDER, HH .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1972, 9 (04) :1193-&

[10]

WIGDOROVICH WN, 1972, SOVIET SOLID STATE P, V16, P2744

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