NOISE FROM NEUTRON INDUCED DEFECTS IN JUNCTION FIELD EFFECT TRANSISTORS

[1] ACKERMAN LW, 1970, JUL IEEE NUCL SPAC R

[2] GILLESPIE AB, 1953, SIGNAL NOISE RESOLUT, P23

[3] GREGORY BL, PERSONAL COMMUNICATI

[4] GREGORY BL, 1970, JUL IEEE NUCL SPAC R

[5] GROVE AS, 1967, PHYS TECHNOL S, P174

[6] HOLMES RR, PERSONAL COMMUNICATI

[7] KERN HE, 1970, IEEE NUCL S, VNS17, P425

[8] LOW-FREQUENCY GENERATION NOISE IN JUNCTION FIELD EFFECT TRANSISTORS [J]. SOLID-STATE ELECTRONICS, 1965, 8 (01) : 41 - +

[9] NOISE IN SEMICONDUCTORS - SPECTRUM OF A 2-PARAMETER RANDOM SIGNAL [J]. JOURNAL OF APPLIED PHYSICS, 1954, 25 (03) : 341 - 343

[10] SPONTANEOUS FLUCTUATIONS IN LEAKAGE CURRENT DUE TO CHARGE GENERATION AND RECOMBINATION IN SEMICONDUCTOR DIODES [J]. SOLID-STATE ELECTRONICS, 1966, 9 (11-1) : 1067 - &

[1] ACKERMAN LW, 1970, JUL IEEE NUCL SPAC R

[2] GILLESPIE AB, 1953, SIGNAL NOISE RESOLUT, P23

[3] GREGORY BL, PERSONAL COMMUNICATI

[4] GREGORY BL, 1970, JUL IEEE NUCL SPAC R

[5] GROVE AS, 1967, PHYS TECHNOL S, P174

[6] HOLMES RR, PERSONAL COMMUNICATI

[7] KERN HE, 1970, IEEE NUCL S, VNS17, P425

[8] LOW-FREQUENCY GENERATION NOISE IN JUNCTION FIELD EFFECT TRANSISTORS [J]. SOLID-STATE ELECTRONICS, 1965, 8 (01) : 41 - +

[9] NOISE IN SEMICONDUCTORS - SPECTRUM OF A 2-PARAMETER RANDOM SIGNAL [J]. JOURNAL OF APPLIED PHYSICS, 1954, 25 (03) : 341 - 343

[10] SPONTANEOUS FLUCTUATIONS IN LEAKAGE CURRENT DUE TO CHARGE GENERATION AND RECOMBINATION IN SEMICONDUCTOR DIODES [J]. SOLID-STATE ELECTRONICS, 1966, 9 (11-1) : 1067 - &