BIAS-DEPENDENT 1-F NOISE MODEL OF AN MOS-TRANSISTOR

[1] Backensto W. V., 1976, International Electron Devices Meeting. (Technical digest), P287

[2] BACKENSTO WV, 1975, THESIS UCLA

[3] BACKENSTO WV, UNPUBLISHED

[4] BACKENSTO WV, 1975, IEDM TECHNICAL DIGES

[5] THE STATISTICS OF CHARGE CARRIER FLUCTUATIONS IN SEMICONDUCTORS [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1956, 69 (10): : 1020 - 1027

[6] Burstein E., 1957, SEMICONDUCTOR SURFAC

[7] CHRISTENSSON S, 1968, SOLID STATE ELECTRON, V2, P707

[8] MEASUREMENTS AND INTERPRETATION OF LOW-FREQUENCY NOISE IN FETS [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1974, ED21 (04) : 247 - 257

[9] THEORY AND EXPERIMENTS ON SURFACE 1/F NOISE [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1972, ED19 (02) : 273 - +

[10] EFFECTS OF SUBSTRATE ON SURFACE STATE NOISE IN SILICON MOS FETS [J]. SOLID-STATE ELECTRONICS, 1972, 15 (01) : 117 - +

[1] Backensto W. V., 1976, International Electron Devices Meeting. (Technical digest), P287

[2] BACKENSTO WV, 1975, THESIS UCLA

[3] BACKENSTO WV, UNPUBLISHED

[4] BACKENSTO WV, 1975, IEDM TECHNICAL DIGES

[5] THE STATISTICS OF CHARGE CARRIER FLUCTUATIONS IN SEMICONDUCTORS [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1956, 69 (10): : 1020 - 1027

[6] Burstein E., 1957, SEMICONDUCTOR SURFAC

[7] CHRISTENSSON S, 1968, SOLID STATE ELECTRON, V2, P707

[8] MEASUREMENTS AND INTERPRETATION OF LOW-FREQUENCY NOISE IN FETS [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1974, ED21 (04) : 247 - 257

[9] THEORY AND EXPERIMENTS ON SURFACE 1/F NOISE [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1972, ED19 (02) : 273 - +

[10] EFFECTS OF SUBSTRATE ON SURFACE STATE NOISE IN SILICON MOS FETS [J]. SOLID-STATE ELECTRONICS, 1972, 15 (01) : 117 - +