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EFFECTS OF SUBSTRATE ON SURFACE STATE NOISE IN SILICON MOS FETS
被引:7
作者
:
HASLETT, JW
论文数:
0
引用数:
0
h-index:
0
HASLETT, JW
TROFIMENKOFF, FN
论文数:
0
引用数:
0
h-index:
0
TROFIMENKOFF, FN
机构
:
来源
:
SOLID-STATE ELECTRONICS
|
1972年
/ 15卷
/ 01期
关键词
:
D O I
:
10.1016/0038-1101(72)90072-X
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:117 / +
页数:1
相关论文
共 26 条
[1]
MAXIMUM DRIFT VELOCITY OF MOS-FIELD-EFFECT TRANSISTORS
BAUM, G
论文数:
0
引用数:
0
h-index:
0
BAUM, G
[J].
SOLID-STATE ELECTRONICS,
1970,
13
(06)
: 789
-
+
[2]
DRIFT VELOCITY SATURATION IN MOS TRANSISTORS
BAUM, G
论文数:
0
引用数:
0
h-index:
0
BAUM, G
BENEKING, H
论文数:
0
引用数:
0
h-index:
0
BENEKING, H
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1970,
ED17
(06)
: 481
-
+
[3]
THEORY OF LOW FREQUENCY NOISE IN SI MOSTS
BERZ, F
论文数:
0
引用数:
0
h-index:
0
BERZ, F
[J].
SOLID-STATE ELECTRONICS,
1970,
13
(05)
: 631
-
+
[4]
A POSSIBLE MECHANISM FOR 1/F NOISE GENERATION IN SEMICONDUCTOR FILAMENTS
BESS, L
论文数:
0
引用数:
0
h-index:
0
BESS, L
[J].
PHYSICAL REVIEW,
1953,
91
(06):
: 1569
-
1569
[5]
Burstein E., 1957, SEMICONDUCTOR SURFAC
[6]
CORRELATION OF EXPERIMENTS WITH A 2-SECTION-MODEL THEORY OF SATURATION DRAIN CONDUCTANCE OF MOS TRANSISTORS
CHIU, TL
论文数:
0
引用数:
0
h-index:
0
CHIU, TL
SAH, CT
论文数:
0
引用数:
0
h-index:
0
SAH, CT
[J].
SOLID-STATE ELECTRONICS,
1968,
11
(12)
: 1149
-
+
[7]
LOW FREQUENCY NOISE IN MOS TRANSISTORS .I. THEORY
CHRISTEN.S
论文数:
0
引用数:
0
h-index:
0
机构:
Research Laboratory of Electronics, Chalmers University of Technology, Gothenburg
CHRISTEN.S
LUNDSTRO.I
论文数:
0
引用数:
0
h-index:
0
机构:
Research Laboratory of Electronics, Chalmers University of Technology, Gothenburg
LUNDSTRO.I
SVENSSON, C
论文数:
0
引用数:
0
h-index:
0
机构:
Research Laboratory of Electronics, Chalmers University of Technology, Gothenburg
SVENSSON, C
[J].
SOLID-STATE ELECTRONICS,
1968,
11
(09)
: 797
-
&
[8]
LOW FREQUENCY NOISE IN MOS FIELD EFFECT TRANSISTORS
FLINN, I
论文数:
0
引用数:
0
h-index:
0
FLINN, I
BEW, G
论文数:
0
引用数:
0
h-index:
0
BEW, G
BERZ, F
论文数:
0
引用数:
0
h-index:
0
BERZ, F
[J].
SOLID-STATE ELECTRONICS,
1967,
10
(08)
: 833
-
&
[9]
CONDUCTANCE OF MOS TRANSISTORS IN SATURATION
FROHMANB.D
论文数:
0
引用数:
0
h-index:
0
机构:
Research and Development Laboratory, Fairchild Semiconductor, Palo Alto, Calif.
FROHMANB.D
GROVE, AS
论文数:
0
引用数:
0
h-index:
0
机构:
Research and Development Laboratory, Fairchild Semiconductor, Palo Alto, Calif.
GROVE, AS
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1969,
ED16
(01)
: 108
-
+
[10]
QUANTUM MECHANICAL CALCULATION OF CARRIER DISTRIBUTION AND THICKNESS OF INVERSION LAYER OF A MOS FIELD-EFFECT TRANSISTOR
GNADINGER, AP
论文数:
0
引用数:
0
h-index:
0
GNADINGER, AP
TALLEY, HE
论文数:
0
引用数:
0
h-index:
0
TALLEY, HE
[J].
SOLID-STATE ELECTRONICS,
1970,
13
(09)
: 1301
-
+
←
1
2
3
→
共 26 条
[1]
MAXIMUM DRIFT VELOCITY OF MOS-FIELD-EFFECT TRANSISTORS
BAUM, G
论文数:
0
引用数:
0
h-index:
0
BAUM, G
[J].
SOLID-STATE ELECTRONICS,
1970,
13
(06)
: 789
-
+
[2]
DRIFT VELOCITY SATURATION IN MOS TRANSISTORS
BAUM, G
论文数:
0
引用数:
0
h-index:
0
BAUM, G
BENEKING, H
论文数:
0
引用数:
0
h-index:
0
BENEKING, H
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1970,
ED17
(06)
: 481
-
+
[3]
THEORY OF LOW FREQUENCY NOISE IN SI MOSTS
BERZ, F
论文数:
0
引用数:
0
h-index:
0
BERZ, F
[J].
SOLID-STATE ELECTRONICS,
1970,
13
(05)
: 631
-
+
[4]
A POSSIBLE MECHANISM FOR 1/F NOISE GENERATION IN SEMICONDUCTOR FILAMENTS
BESS, L
论文数:
0
引用数:
0
h-index:
0
BESS, L
[J].
PHYSICAL REVIEW,
1953,
91
(06):
: 1569
-
1569
[5]
Burstein E., 1957, SEMICONDUCTOR SURFAC
[6]
CORRELATION OF EXPERIMENTS WITH A 2-SECTION-MODEL THEORY OF SATURATION DRAIN CONDUCTANCE OF MOS TRANSISTORS
CHIU, TL
论文数:
0
引用数:
0
h-index:
0
CHIU, TL
SAH, CT
论文数:
0
引用数:
0
h-index:
0
SAH, CT
[J].
SOLID-STATE ELECTRONICS,
1968,
11
(12)
: 1149
-
+
[7]
LOW FREQUENCY NOISE IN MOS TRANSISTORS .I. THEORY
CHRISTEN.S
论文数:
0
引用数:
0
h-index:
0
机构:
Research Laboratory of Electronics, Chalmers University of Technology, Gothenburg
CHRISTEN.S
LUNDSTRO.I
论文数:
0
引用数:
0
h-index:
0
机构:
Research Laboratory of Electronics, Chalmers University of Technology, Gothenburg
LUNDSTRO.I
SVENSSON, C
论文数:
0
引用数:
0
h-index:
0
机构:
Research Laboratory of Electronics, Chalmers University of Technology, Gothenburg
SVENSSON, C
[J].
SOLID-STATE ELECTRONICS,
1968,
11
(09)
: 797
-
&
[8]
LOW FREQUENCY NOISE IN MOS FIELD EFFECT TRANSISTORS
FLINN, I
论文数:
0
引用数:
0
h-index:
0
FLINN, I
BEW, G
论文数:
0
引用数:
0
h-index:
0
BEW, G
BERZ, F
论文数:
0
引用数:
0
h-index:
0
BERZ, F
[J].
SOLID-STATE ELECTRONICS,
1967,
10
(08)
: 833
-
&
[9]
CONDUCTANCE OF MOS TRANSISTORS IN SATURATION
FROHMANB.D
论文数:
0
引用数:
0
h-index:
0
机构:
Research and Development Laboratory, Fairchild Semiconductor, Palo Alto, Calif.
FROHMANB.D
GROVE, AS
论文数:
0
引用数:
0
h-index:
0
机构:
Research and Development Laboratory, Fairchild Semiconductor, Palo Alto, Calif.
GROVE, AS
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1969,
ED16
(01)
: 108
-
+
[10]
QUANTUM MECHANICAL CALCULATION OF CARRIER DISTRIBUTION AND THICKNESS OF INVERSION LAYER OF A MOS FIELD-EFFECT TRANSISTOR
GNADINGER, AP
论文数:
0
引用数:
0
h-index:
0
GNADINGER, AP
TALLEY, HE
论文数:
0
引用数:
0
h-index:
0
TALLEY, HE
[J].
SOLID-STATE ELECTRONICS,
1970,
13
(09)
: 1301
-
+
←
1
2
3
→