METHOD OF CORRECTION FOR ABSORPTION MATRIX EFFECTS IN SAMPLES OF INTERMEDIATE THICKNESS IN EDXRF ANALYSIS

被引：21

作者：

MARKOWICZ, A

机构：

[1] Institute of Physics and Nuclear Techniques, Academy of Mining and Metallurgy, Cracow, 30-059

来源：

X-RAY SPECTROMETRY | 1979年 / 8卷 / 01期

关键词：

D O I：

10.1002/xrs.1300080107

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

Theoretical grounds for a method of the elimination of absorption matrix effects based upon the application of the measurement of the intensity of the coherent scattered and Compton scattered X‐rays are presented in this paper. The presented method has been confirmed experimentally. The described method of the elimination of the absorption matrix effect can be applied, in the case of samples having ‘intermediate’ masses per unit area, by means of analysis by the X‐ray fluorescence method. The total error (standard deviation) of correction for absorption obtained by the proposed method varies from 3–7% for the values of this correction from 2.5–1.3 respectively. The presented method can be used in the trace analysis of biological and environmental materials. Copyright © 1979 Heyden & Son Ltd.

引用

页码：14 / 18

页数：5

共 13 条

[1]

BTOCHIN MA, 1959, MIETODY RIENTGENO SP

[2] SENSITIVITY OF RADIOISOTOPE XRF TECHNIQUE WITH PARTICULAR REFERENCE TO PORTABLE UNITS [J].