THE IDENTIFICATION OF PRECIPITATE PARTICLES IN SINGLE CRYSTALS OF SILICON BY REFLECTION ELECTRON DIFFRACTION

被引：17

作者：

NEWMAN, RC

机构：

来源：

PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON | 1960年 / 76卷 / 492期

关键词：

D O I：

10.1088/0370-1328/76/6/421

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：993 / 996

页数：4

共 13 条

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[3] BULLOUGH R, 1959, P IEE B S15, V106, P277
[4] INTERACTIONS BETWEEN SOLUTES IN GERMANIUM AND SILICON
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[5] GASSON DB, 1959, P I ELECT ENG B S17, V106, P854
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NEWMAN, RC
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[7] HOLMES PJ, 1959, P I ELECT ENG B S15, V106, P287
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[9] BEHAVIOR OF OXYGEN IN PLASTICALLY DEFORMED SILICON
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[10] ELECTRON-OPTICAL DESIGN OF AN X-RAY MICRO-ANALYSER
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