SHIELDING OF IMPURITIES AS MEASURED BY EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE

被引：16

作者：

STERN, EA

SAYERS, DE

机构：

[1] UNIV WASHINGTON,PHYS DEPT,SEATTLE,WA 98195

[2] BOEING CO,SEATTLE,WA 98124

来源：

关键词：

D O I：

10.1103/PhysRevLett.30.174

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：174 / 177

页数：4

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[7]

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SAYERS, DE ;

STERN, EA ;

LYTLE, FW .

[10]

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