XENON SENSITIZED PHOTOLYSIS OF CARBON DIOXIDE

被引:18
作者
STIEF, LJ
DECARLO, VJ
PAYNE, WA
机构
[1] NASA/Goddard Space Flight Center, Greenbelt
[2] Xerox Corporation, Rochester, NY, Xerox Square
[3] NASA/Goddard Space Flieht Center, Greenbelt
关键词
D O I
10.1063/1.1672516
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The xenon-sensitized photolysis of CO2 has been examined and contrasted with the direct photolysis at the 1470-Å Xe resonance line. In the Xe-sensitized system, the following results were obtained: the quantum yield for CO production φCO equals 2 at low pressure of CO2; φco decreases toward unity upon addition of several gases whose relative efficiencies are as follows: CO2 = 1.00, Xe = 0.90, He=0.14, Kr=0.06, and C2F6=0; complete recovery of O2 (O 3/CO = 0.50) is always achieved. The principal reactions required to explain these results are: Xe+hν → Xe, Xe* + CO2 → Xe+CO+O(1D)† O(1D)†+CO2 → CO3*, CO3* → CO+O2, CO 3*+M → O(3P) or O(1D)+CO 2+M. where O(1D)† represents electronically excited atomic oxygen containing excess kinetic energy. The high efficiency of He in this system (0.14) compared to that previously established for O(1D) with no excess kinetic energy (0.02) lends support to participation of O( 1D)† in the Xe-sensitized photolysis of CO2.
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页码:3336 / &
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