ION BACKSCATTERING STUDIES OF THE LIQUID SOLID INTERFACE

被引：12

作者：

FORSTER, JS

PHILLIPS, D

GULENS, J

HARRINGTON, DA

TAPPING, RL

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1987年 / 28卷 / 03期

关键词：

D O I：

10.1016/0168-583X(87)90180-7

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：385 / 390

页数：6

共 10 条

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[7] ION CHANNELING THROUGH A THIN SI-LIQUID INTERFACE [J].

PADMANABHAN, KR ;

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APPLIED PHYSICS LETTERS, 1986, 48 (09) :578-580

[8] PROTON ELASTIC SCATTERING CROSS SECTIONS OF SI, CL, K, SC, TI, AND MN [J].

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[9] ULTRAHIGH-VACUUM APPARATUS FOR COMBINED LOW-ENERGY ELECTRON-DIFFRACTION, AUGER-SPECTROSCOPY, MEV ION-SCATTERING, AND NUCLEAR MICROANALYSIS [J].

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[10]

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