ULTRA-MICROHARDNESS OF VACUUM-DEPOSITED FILMS .1. ULTRA-MICROHARDNESS TESTER

[1] IDA I, 1963, REV ELECTR COMMUN LA, V11, P139

[2] KINOSIT K, 1965, PROGR OPTICS, V4, P87

[3] RECENT DEVELOPMENTS IN STUDY OF MECHANICAL PROPERTIES OF THIN-FILMS [J]. THIN SOLID FILMS, 1972, 12 (01) : 17 - &

[4] KRANERT W, 1943, ANN PHYSIK, V43, P520

[5] VICKERS TYPE ULTRA-MICROHARDNESS TESTER FOR THIN-FILMS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1972, 11 (05) : 758 - +

[6] NISHIBORI M, 1973, SOLID STATE PHYSICS, V7, P261

[7] PALATNIK LS, 1964, ZAVOD LAB, V30, P1097

[8] ELLIPSOMETRIC STUDY OF POLISHED GLASS SURFACES [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1964, 3 (12) : 805 - &

[1] IDA I, 1963, REV ELECTR COMMUN LA, V11, P139

[2] KINOSIT K, 1965, PROGR OPTICS, V4, P87

[3] RECENT DEVELOPMENTS IN STUDY OF MECHANICAL PROPERTIES OF THIN-FILMS [J]. THIN SOLID FILMS, 1972, 12 (01) : 17 - &

[4] KRANERT W, 1943, ANN PHYSIK, V43, P520

[5] VICKERS TYPE ULTRA-MICROHARDNESS TESTER FOR THIN-FILMS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1972, 11 (05) : 758 - +

[6] NISHIBORI M, 1973, SOLID STATE PHYSICS, V7, P261

[7] PALATNIK LS, 1964, ZAVOD LAB, V30, P1097

[8] ELLIPSOMETRIC STUDY OF POLISHED GLASS SURFACES [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1964, 3 (12) : 805 - &