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QUANTITATIVE SURFACE-TOPOGRAPHY DETERMINATION BY NOMARSKI REFLECTION MICROSCOPY .2. MICROSCOPE MODIFICATION, CALIBRATION, AND PLANAR SAMPLE EXPERIMENTS

被引：29
作者：
HARTMAN, JS
GORDON, RL
LESSOR, DL
机构：
来源：
APPLIED OPTICS | 1980年 / 19卷 / 17期
关键词：
D O I：
10.1364/AO.19.002998
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：2998 / 3009
页数：12
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[4]   QUANTITATIVE SURFACE-TOPOGRAPHY DETERMINATION BY NOMARSKI REFLECTION MICROSCOPY .1. THEORY [J].
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[5]   AN ALGORITHM FOR LEAST-SQUARES ESTIMATION OF NONLINEAR PARAMETERS [J].
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