COMMENTS ON CIRCUIT MODELS FOR MOSFET THERMAL NOISE

被引：8

作者：

FOX, RM

机构：

[1] Department of Electrical Engineering, University of Florida, Gainesville, FL

来源：

IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1993年 / 28卷 / 02期

关键词：

D O I：

10.1109/4.192054

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

It is shown that some current and proposed SPICE models for MOS thermal noise are inconsistent, either when moving from one operating region to another or when changing model levels. A different model is shown to be consistent with theory in all regions and with all SPICE model levels. The reasons for the inconsistency are explored.

引用

页码：184 / 185

页数：2

共 6 条

[1]

Allen P. E., 1987, CMOS ANALOG CIRCUIT

[2] SIMULATION-ORIENTED NOISE MODEL FOR MOS DEVICES [J].