SIMPLE METHOD FOR CALCULATING OPTICAL-PROPERTIES OF MULTILAYER-DIELECTRIC REFLECTORS

被引：10

作者：

SPARKS, M ^{[1
]}

机构：

[1] XONICS INC,SANTA MONICA,CA 90401

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 1977年 / 67卷 / 11期

关键词：

D O I：

10.1364/JOSA.67.001590

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

收藏

页码：1590 / 1594

页数：5

相关论文

共 13 条

[1] [Anonymous], COMMUNICATION
[2] USE OF HAFNIUM DIOXIDE IN MULTILAYER DIELECTRIC REFLECTORS FOR NEAR UV
BAUMEISTER, P
ARNON, O
[J]. APPLIED OPTICS, 1977, 16 (02): : 439 - 444
[3] PRECISE METHOD FOR MEASURING ABSOLUTE PHASE CHANGE ON REFLECTION
BENNETT, JM
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1964, 54 (05) : 612 - &
[4] Dufour C., 1952, REV OPT, V31, P1
[5] FLANNERY MR, UNPUBLISHED
[6] Goodman J. W., 1968, INTRO FOURIER OPTICS, P3
[7] Heavens O.S, 1955, OPTICAL PROPERTIES T
[8] KOPPELMANN G, 1960, ANN PHYS, V7, P388
[9] OPTICAL APPLICATIONS OF DIELECTRIC THIN FILMS
LISSBERG.PH
[J]. REPORTS ON PROGRESS IN PHYSICS, 1970, 33 (03) : 197 - &
[10] PROBLEM OF PHASE VARIATION WITH WAVELENGHT IN DIELECTRIC FILMS - EXTENSION OF INTERFEROMETRIC STANDARDS INTO THE INFRARED
RANK, DH
BENNETT, HE
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1955, 45 (02) : 69 - 73