HIGH-SENSITIVITY ELECTRON SPECTROMETER

被引：33

作者：

HUCHITAL, DA

RIGDEN, JD

机构：

来源：

APPLIED PHYSICS LETTERS | 1970年 / 16卷 / 09期

关键词：

D O I：

10.1063/1.1653221

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：348 / &

共 10 条

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[3]

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[4]

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[6]

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[9] RESOLUTION AND SENSITIVITY CONSIDERATIONS OF AN AUGER ELECTRON SPECTROMETER BASED ON DISPLAY LEED OPTICS [J].

TAYLOR, NJ .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (06) :792-&

[10] USE OF LEED APPARATUS FOR DETECTION AND IDENTIFICATION OF SURFACE CONTAMINANTS [J].

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PERIA, WT .

JOURNAL OF APPLIED PHYSICS, 1967, 38 (11) :4355-&

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