FIELD-EMISSION FROM AN ELLIPTIC BOSS - EXACT AND APPROXIMATE FORMS FOR AREA FACTORS AND CURRENTS

被引:11
作者
JENSEN, KL
ZAIDMAN, EG
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1994年 / 12卷 / 02期
关键词
D O I
10.1116/1.587345
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Field emission from metallic or semiconductor tips, in comparison to planar surfaces, is complicated by current enhancement effects and changes in the image charge. It is shown that the approximations typically used for the calculation of the transmission coefficient, namely, a ''linearized'' Wentzel-Kramers-Brillouin approach and methods based upon the Fowler-Nordheim approach, are inappropriate for small spherical surfaces but adequate for elliptical surfaces. The derivation of the approximate approaches is given, as well as a simple analytical formula for the average emitting area, which may be derived based on the Fowler-Nordheim equation. By use of the elliptical approximation for the tip geometry, a simple scale factor is sufficient to deal with spherical and pointed tips.
引用
收藏
页码:776 / 780
页数:5
相关论文
共 13 条
[1]   DERIVATION OF THE IMAGE INTERACTION FOR NONPLANAR POINTED EMITTER GEOMETRIES - APPLICATION TO FIELD-EMISSION IV CHARACTERISTICS [J].
HE, J ;
CUTLER, PH ;
MISKOVSKY, NM ;
FEUCHTWANG, TE ;
SULLIVAN, TE ;
CHUNG, M .
SURFACE SCIENCE, 1991, 246 (1-3) :348-364
[2]   GENERALIZATION OF FOWLER-NORDHEIM FIELD-EMISSION THEORY FOR NONPLANAR METAL EMITTERS [J].
HE, J ;
CUTLER, PH ;
MISKOVSKY, NM .
APPLIED PHYSICS LETTERS, 1991, 59 (13) :1644-1646
[3]   STRUCTURE AND ELECTRICAL CHARACTERISTICS OF SILICON FIELD-EMISSION MICROELECTRONIC DEVICES [J].
HUNT, CE ;
TRUJILLO, JT ;
ORVIS, WJ .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1991, 38 (10) :2309-2313
[4]   NUMERICAL-SIMULATION OF FIELD-EMISSION FROM SILICON [J].
JENSEN, KL ;
GANGULY, AK .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1993, 11 (02) :371-378
[5]   NUMERICAL-SIMULATION OF FIELD-EMISSION AND TUNNELING - A COMPARISON OF THE WIGNER FUNCTION AND TRANSMISSION COEFFICIENT APPROACHES [J].
JENSEN, KL ;
GANGULY, AK .
JOURNAL OF APPLIED PHYSICS, 1993, 73 (09) :4409-4427
[6]   ANALYSIS OF FIELD-EMISSION FROM 3-DIMENSIONAL STRUCTURES [J].
KIRKPATRICK, DA ;
MANKOFSKY, A ;
TSANG, KT .
APPLIED PHYSICS LETTERS, 1992, 60 (17) :2065-2067
[7]  
Modinos A., 1984, FIELD THERMIONIC SEC
[8]   PHYSICAL BASIS FOR APPLYING THE FOWLER-NORDHEIM J-E RELATIONSHIP TO EXPERIMENTAL IV DATA [J].
NICOLAESCU, D .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1993, 11 (02) :392-395
[9]  
PHILLIPS PM, 1991, 4TH INT VAC MICR C O
[10]  
SHAW JL, 1993, UNPUB 6TH INT VAC MI