ION-BEAM SPECTROSCOPY OF SOLIDS AND SURFACES

被引：82

作者：

GARRISON, BJ

WINOGRAD, N

机构：

来源：

SCIENCE | 1982年 / 216卷 / 4548期

关键词：

D O I：

10.1126/science.216.4548.805

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

引用

收藏

页码：805 / 812

页数：8

相关论文

共 51 条

[1] ION MICROPROBE MASS ANALYZER
ANDERSEN, CA
HINTHORNE, JR
[J]. SCIENCE, 1972, 175 (4024) : 853 - +
[2] FAST ATOM BOMBARDMENT OF SOLIDS (FAB) - A NEW ION-SOURCE FOR MASS-SPECTROMETRY
BARBER, M
BORDOLI, RS
SEDGWICK, RD
TYLER, AN
[J]. JOURNAL OF THE CHEMICAL SOCIETY-CHEMICAL COMMUNICATIONS, 1981, (07) : 325 - 327
[3] BARDOLI RS, 1979, SURF SCI, V85, P244
[4] BARLAK TM, J AM CHEM SOC
[5] DEVELOPMENTS IN SECONDARY ION MASS-SPECTROSCOPY AND APPLICATIONS TO SURFACE STUDIES
BENNINGHOVEN, A
[J]. SURFACE SCIENCE, 1975, 53 (DEC) : 596 - 625
[6] SECONDARY-ION EMISSION OF AMINO-ACIDS
BENNINGHOVEN, A
JASPERS, D
SICHTERMANN, W
[J]. APPLIED PHYSICS, 1976, 11 (01): : 35 - 39
[7] BENNINGHOVEN A, 1979, SPRINGER SERIES CHEM, V9
[8] LOCALIZED TIME-DEPENDENT PERTURBATIONS IN METALS - FORMALISM AND SIMPLE EXAMPLES
BLANDIN, A
NOURTIER, A
HONE, DW
[J]. JOURNAL DE PHYSIQUE, 1976, 37 (04): : 369 - 378
[9] EFFECT OF CLUSTER SURFACE ENERGIES ON SECONDARY-ION-INTENSITY DISTRIBUTIONS FROM IONIC-CRYSTALS
CAMPANA, JE
BARLAK, TM
COLTON, RJ
DECORPO, JJ
WYATT, JR
DUNLAP, BI
[J]. PHYSICAL REVIEW LETTERS, 1981, 47 (15) : 1046 - 1049
[10] OXYGEN-ADSORPTION ON MOLYBDENUM STUDIED BY LOW-ENERGY SECONDARY-ION MASS-SPECTROMETRY AND ELECTRON-INDUCED DESORPTION
DAWSON, PH
[J]. PHYSICAL REVIEW B, 1977, 15 (12): : 5522 - 5534

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