CONTROLLED SURFACE FLAW-INITIATED FRACTURE IN REACTION-DENSIFIED SILICON-CARBIDE

被引:11
作者
WILLS, RR
WIMMER, JM
机构
[1] BATTELLE MEM INST,COLUMBUS LABS,COLUMBUS,OH 43201
[2] USAF,MAT LAB,WRIGHT PATTERSON AFB,OH 45433
关键词
D O I
10.1111/j.1151-2916.1976.tb09513.x
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:437 / 440
页数:4
相关论文
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