METHOD OF CONTINUOUSLY MEASURING WORK FUNCTION CHANGES

[1] ERTL G, 1974, LOW ENERGY ELECTRONS, pCH8

[2] AC RETARDING POTENTIAL TECHNIQUE FOR CONTINUOUS MEASUREMENT OF CHANGES IN WORK FUNCTION [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1974, 7 (10): : 851 - 854

[3] TAYLOR JL, SURF SCI

[4] TAYLOR JL, 1978, THESIS CALIFORNIA I

[5] RESOLUTION AND SENSITIVITY CONSIDERATIONS OF AN AUGER ELECTRON SPECTROMETER BASED ON DISPLAY LEED OPTICS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (06) : 792 - &

[6] INTERFERENCE EFFECTS IN REFLECTION OF LOW-ENERGY ELECTRONS FROM THIN FILMS OF AU ON IR [J]. JOURNAL OF APPLIED PHYSICS, 1970, 41 (13) : 5330 - &

[7] HIGH-RESOLUTION MEASUREMENTS OF ELECTRON ENERGY DISTRIBUTION PEAK SHIFTS [J]. APPLIED PHYSICS LETTERS, 1971, 19 (10) : 388 - &

[8] ADSORPTION OF MOLECULAR NITROGEN BY W(110) PLANE [J]. SURFACE SCIENCE, 1976, 58 (02) : 469 - 478

[1] ERTL G, 1974, LOW ENERGY ELECTRONS, pCH8

[2] AC RETARDING POTENTIAL TECHNIQUE FOR CONTINUOUS MEASUREMENT OF CHANGES IN WORK FUNCTION [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1974, 7 (10): : 851 - 854

[3] TAYLOR JL, SURF SCI

[4] TAYLOR JL, 1978, THESIS CALIFORNIA I

[5] RESOLUTION AND SENSITIVITY CONSIDERATIONS OF AN AUGER ELECTRON SPECTROMETER BASED ON DISPLAY LEED OPTICS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (06) : 792 - &

[6] INTERFERENCE EFFECTS IN REFLECTION OF LOW-ENERGY ELECTRONS FROM THIN FILMS OF AU ON IR [J]. JOURNAL OF APPLIED PHYSICS, 1970, 41 (13) : 5330 - &

[7] HIGH-RESOLUTION MEASUREMENTS OF ELECTRON ENERGY DISTRIBUTION PEAK SHIFTS [J]. APPLIED PHYSICS LETTERS, 1971, 19 (10) : 388 - &

[8] ADSORPTION OF MOLECULAR NITROGEN BY W(110) PLANE [J]. SURFACE SCIENCE, 1976, 58 (02) : 469 - 478