ION MICROPROBE MEASUREMENTS OF CONCENTRATION DEPTH PROFILES OF ERBIUM OXIDE ON THIN-FILM ERBIUM METAL

被引:3
作者
GUTHRIE, JW [1 ]
机构
[1] SANDIA LABS,APPL PHYS DIV,ALBUQUERQUE,NM 87115
来源
JOURNAL OF THE LESS-COMMON METALS | 1973年 / 30卷 / 02期
关键词
D O I
10.1016/0022-5088(73)90120-3
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:317 / 320
页数:4
相关论文
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