N-CHANNEL POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS USING AS-DEPOSITED POLYCRYSTALLINE SILICON AND ION DOPING

被引:20
作者
LIM, HJ [1 ]
RYU, BY [1 ]
JANG, J [1 ]
机构
[1] KYUNG HEE UNIV,BASIC SCI RES INST,DONGDAEMOON KU,SEOUL 130701,SOUTH KOREA
关键词
D O I
10.1063/1.113463
中图分类号
O59 [应用物理学];
学科分类号
摘要
Polycrystalline silicon (poly-Si) thin film transistors (TFTs) were fabricated using as-deposited poly-Si and ion doping. The poly-Si was prepared by a remote plasma chemical vapour deposition at the substrate temperature of 280°C using a mixture gas of SiF4, SiH4, He, and H2. The n-channel poly-Si TFTs using as-deposited poly-Si and ion doping exhibited a field effect mobility of 12 cm2/Vs, a threshold voltage of 4 V, and a gate voltage swing of 1.80 V/decade.© 1995 American Institute of Physics.
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页码:2888 / 2890
页数:3
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