RECRYSTALLIZATION NEAR LOW-ANGLE [001] TILT BOUNDARIES FOLLOWING COBALT IMPLANTATION IN BICRYSTALLINE THIN-FILMS OF GOLD

被引：3

作者：

KOMEM, Y ^{[1
]}

GREENBERG, A ^{[1
]}

BAUER, CL ^{[1
]}

机构：

[1] CARNEGIE MELLON UNIV,DEPT MET & MAT SCI,PITTSBURGH,PA 15213

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1981年 / 64卷 / 01期

关键词：

D O I：

10.1002/pssa.2210640134

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：317 / 324

页数：8

共 17 条

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[3] CHARACTERIZATION OF [001] TILT BOUNDARIES PRODUCED BY EPITAXIAL-GROWTH ON BICRYSTALLINE SUBSTRATES OF NACL [J].

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[5] FACETING OF [001] GRAIN-BOUNDARIES IN BICRYSTALLINE THIN-FILMS OF GOLD [J].

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[8] PHYSICAL STATE OF IMPLANTED TUNGSTEN IN COPPER [J].

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[9]

DEARNALEY G, 1973, ION IMPLANTATION, P42

[10] DIFFUSION OF IRON, COBALT AND NICKEL IN GOLD [J].

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