ARC ANNEALING OF BF+2 IMPLANTED SILICON BY A SHORT PULSE FLASH LAMP

被引:24
作者
LUE, JT
机构
关键词
D O I
10.1063/1.91279
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:73 / 76
页数:4
相关论文
共 12 条
[1]   PROPERTIES OF LASER-ASSISTED DOPING IN SILICON [J].
AFFOLTER, K ;
LUTHY, W ;
VONALLMEN, M .
APPLIED PHYSICS LETTERS, 1978, 33 (02) :185-187
[2]   MELTING MODEL FOR PULSING-LASER ANNEALING OF IMPLANTED SEMICONDUCTORS [J].
BAERI, P ;
CAMPISANO, SU ;
FOTI, G ;
RIMINI, E .
JOURNAL OF APPLIED PHYSICS, 1979, 50 (02) :788-797
[3]  
BOMBE HA, 1978, APPL PHYS LETT, V33, P955
[4]   THERMALLY ASSISTED FLASH ANNEALING OF SILICON AND GERMANIUM [J].
COHEN, RL ;
WILLIAMS, JS ;
FELDMAN, LC ;
WEST, KW .
APPLIED PHYSICS LETTERS, 1978, 33 (08) :751-753
[5]   CRYSTALLINE TO AMORPHOUS TRANSFORMATION IN ION-IMPLANTED SILICON - COMPOSITE MODEL [J].
DENNIS, JR ;
HALE, EB .
JOURNAL OF APPLIED PHYSICS, 1978, 49 (03) :1119-1127
[6]  
MAROTTA A, 1978, APPL PHYS LETT, V33, P15
[7]   COMPUTER-SIMULATION OF LASER ANNEALING SILICON AT 1.06 MU-M [J].
SCHULTZ, JC ;
COLLINS, RJ .
APPLIED PHYSICS LETTERS, 1979, 34 (01) :84-87
[8]  
SEIDEL TE, 1971, RAD EFF, V7
[9]  
SONG DY, UNPUBLISHED
[10]  
SZE SM, 1969, PHYSICS SEMICONDUCTO, P104