CHARACTERIZATION OF MONOLITHIC N-TYPE 6H-SIC PIEZORESISTIVE SENSING ELEMENTS

被引:65
作者
SHOR, JS
BEMIS, L
KURTZ, AD
机构
[1] Kulite Semiconductor Products, Inc., Leonia NJ
基金
美国国家航空航天局;
关键词
D O I
10.1109/16.285013
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Monolithic, junction isolated piezoresistors have been fabricated in commercially available 6H-SiC. The gauge factor (GF) of these elements has been measured up to 250-degrees-C in both longitudinal and transverse configurations. The maximum GF observed was -29.4, corresponding to the piezoresistive coefficient pi11. A beam transducer with a four-arm integral piezoresistor network was fabricated and tested in a force sensor configuration. The data indicate that n-type 6H-SiC has the potential to be useful in high temperature electromechanical sensors to measure parameters such as pressure, force, strain and acceleration.
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页码:661 / 665
页数:5
相关论文
共 15 条
[1]  
Air Force Cambridge Research Laboratories (U.S.)
[2]  
University of South Carolina in: Silicon Carbide, 1974, SILICON CARBIDE 1973
[3]  
AZIMOV SA, 1975, SOV PHYS SEMICOND+, V8, P1427
[4]  
FIRST DJ, 1966, Patent No. 3245252
[5]  
GUK GN, 1976, SOV PHYS SEMICOND, V9, P823
[6]  
GUK GN, 1974, SOV PHYS SEMICOND, V9, P104
[7]  
HELBIG R, 1989, ELECTROCHEMICAL SOC, V892, P718
[8]   CONTROLLED SUBLIMATION GROWTH OF SINGLE CRYSTALLINE 4H-SIC AND 6H-SIC AND IDENTIFICATION OF POLYTYPES BY X-RAY-DIFFRACTION [J].
KANAYA, M ;
TAKAHASHI, J ;
FUJIWARA, Y ;
MORITANI, A .
APPLIED PHYSICS LETTERS, 1991, 58 (01) :56-58
[9]  
KEYES RW, 1960, SOLID STATE PHYS, V11, P1493
[10]  
Lely A, 1955, BER DEUT KERAM GES, V8, P229