RAMAN ENHANCEMENT METHODS FOR MOLECULAR-STRUCTURE CHARACTERIZATION OF OPTICAL THIN-FILMS

被引：3

作者：

FRIEDRICH, DM

EXARHOS, GJ

机构：

[1] Pacific Northwest Lab, Richland, WA,, USA, Pacific Northwest Lab, Richland, WA, USA

来源：

THIN SOLID FILMS | 1987年 / 154卷 / 1-2期

关键词：

The authors wish to thank W. T. Pawlewicz for providing the sputter-deposited thin films and multilayer coatings; T. H. Nguyen for preparing the anatase-sodium sulfate pellet and R. A. Craig for helpful discussions regarding the electric field modeling calculations. The authors acknowledge support for this work from the Materials SciencesD ivision of the Office of Basic Energy Sciences; U .S. Department of Energy. Previous support from the Air Force Weapons Laboratory; Kirtland Air Force Base; New Mexico; under Contract PO 85-037 is also acknowledged. Pacific Northwest Laboratory is operated by Battelle Memorial Institute for the U.S. Department of Energy under Contract DE-AC06-76RL0 1830;

D O I：

10.1016/0040-6090(87)90370-1

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：257 / 270

页数：14

共 10 条

[1] INTERFERENCE ENHANCED RAMAN-SCATTERING FROM VERY THIN ABSORBING FILMS [J].