MEASURING ON THIN-FILM ELECTROLUMINESCENT DEVICES

[11] NISHIKAWA M, SID 88, P18

[12] PLESHKO P, 1982, SID LECTURE NOTES LO

[13] PHYSICAL CONDITIONS OF COMPUTER-ANALYSIS OF ION BACKSCATTERING [J]. JOURNAL OF APPLIED PHYSICS, 1987, 62 (05) : 2140 - 2142

[14] TANAKA S, SID 88, P293

[15] YAMAUCHI N, SID 87, P230

[11] NISHIKAWA M, SID 88, P18

[12] PLESHKO P, 1982, SID LECTURE NOTES LO

[13] PHYSICAL CONDITIONS OF COMPUTER-ANALYSIS OF ION BACKSCATTERING [J]. JOURNAL OF APPLIED PHYSICS, 1987, 62 (05) : 2140 - 2142

[14] TANAKA S, SID 88, P293

[15] YAMAUCHI N, SID 87, P230