EXCITON LIFETIMES IN CDTE/CDMNTE SINGLE QUANTUM-WELLS

被引：24

作者：

POLHMANN, A

HELLMANN, R

GOBEL, EO

YAKOVLEV, DR

OSSAU, W

WAAG, A

BICKNELLTASSIUS, RN

LANDWEHR, G

机构：

[1] UNIV MARBURG,WISSENSCH ZENTRUM MATERIALWISSENSCH,W-3550 MARBURG,GERMANY

[2] UNIV WURZBURG,INST PHYS,W-8700 WURZBURG,GERMANY

来源：

APPLIED PHYSICS LETTERS | 1992年 / 61卷 / 24期

关键词：

D O I：

10.1063/1.108025

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The lifetime of excitons in CdTe/Cd0.75Mn0.25Te single quantum wells (SQW) has been measured by time-resolved photoluminescence for quantum wells with thicknesses from 34 to 300 angstrom and in the temperature range from 1.6 to 300 K. The exciton lifetimes are of the order of 150 ps at the lowest temperatures, where radiative recombination dominates. The lifetimes are only weakly dependent on well thickness and decrease from 170 to 140 ps for quantum wells with thickness decreasing from 300 to 34 angstrom. A comparison with a high quality GaAs/AlGaAs SQW yields comparable luminescence efficiencies at low temperatures, yet the lifetimes are considerably shorter in the CdTe/Cd0.75Mn0.25Te quantum wells due to the higher exciton oscillator strength.

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页码：2929 / 2931

页数：3

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