SCANNING LASER MASS-SPECTROMETRY FOR TRACE LEVEL SOLUTE CONCENTRATION PROFILES

被引：14

作者：

CONZEMIUS, RJ ^{[1
]}

SCHMIDT, FA ^{[1
]}

SVEC, HJ ^{[1
]}

机构：

[1] IOWA STATE UNIV SCI & TECHNOL,DEPT CHEM,AMES,IA 50011

来源：

关键词：

D O I：

10.1021/ac00235a041

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：1899 / 1902

页数：4

共 8 条

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CONZEMIUS, RJ
SVEC, HJ
[J]. ANALYTICAL CHEMISTRY, 1978, 50 (13) : 1854 - 1860
[2] A REVIEW OF THE APPLICATIONS TO SOLIDS OF THE LASER ION-SOURCE IN MASS-SPECTROMETRY
CONZEMIUS, RJ
CAPELLEN, JM
[J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1980, 34 (3-4): : 197 - 271
[3] FERGERSON LB, 1970, TALANTA, V17, P762
[4] FOSS GO, 1981, THESIS IOWA STATE U
[5] DIFFUSION MECHANISMS IN PD-AU THIN-FILM SYSTEM AND CORRELATION OF RESISTIVITY CHANGES WITH AUGER-ELECTRON SPECTROSCOPY AND RUTHERFORD BACKSCATTERING PROFILES
HALL, PM
MORABITO, JM
POATE, JM
[J]. THIN SOLID FILMS, 1976, 33 (01) : 107 - 134
[6] About a new Mass Spectrograph
Mattauch, J.
Herzog, R.
[J]. ZEITSCHRIFT FUR PHYSIK, 1934, 89 (11-12): : 786 - 795
[7] OKAFOR I, UNPUBLISHED
[8] SCHMIDT FA, 1979, IS4722