ON THE DIFFERENCE BETWEEN LIGHT-EMISSION VERSUS VOLTAGE CHARACTERISTICS IN AIR AND IN ULTRAHIGH-VACUUM

被引：10

作者：

SMOLYANINOV, II ^{[1
]}

机构：

[1] RUSSIAN ACAD SCI,INST SPECT,TROITSK 142092,RUSSIA

来源：

PHYSICS LETTERS A | 1993年 / 181卷 / 02期

关键词：

D O I：

10.1016/0375-9601(93)90916-N

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The difference between the STM light emission versus voltage characteristics L ( V) for the tunneling pp between two metals obtained in air and in ultrahigh vacuum (UHV) is explained. It arises because the distance between the tip and the sample in air has a stronger dependence on the voltage applied than in UHV. In air the different tip-induced plasmon modes can be observed not only in the spectrum of the emitted light as is the case in UHV, but in the L ( V) characteristics as well.

引用

收藏

页码：175 / 178

页数：4

相关论文

共 12 条

[1] ELECTRON INTERFEROMETRY AT CRYSTAL-SURFACES [J].

BECKER, RS ;

GOLOVCHENKO, JA ;

SWARTZENTRUBER, BS .

PHYSICAL REVIEW LETTERS, 1985, 55 (09) :987-990

[2] INELASTIC TUNNELING EXCITATION OF TIP-INDUCED PLASMON MODES ON NOBLE-METAL SURFACES [J].

BERNDT, R ;

GIMZEWSKI, JK ;

JOHANSSON, P .

PHYSICAL REVIEW LETTERS, 1991, 67 (27) :3796-3799

[3]

BERNDT R, 1993, ANN PHYS-LEIPZIG, V2, P133, DOI 10.1002/andp.19935050205

[4] PHOTON-EMISSION EXPERIMENTS WITH THE SCANNING TUNNELLING MICROSCOPE [J].

COOMBS, JH ;

GIMZEWSKI, JK ;

REIHL, B ;

SASS, JK ;

SCHLITTLER, RR .

JOURNAL OF MICROSCOPY-OXFORD, 1988, 152 :325-336

[5]

CORATGER R, 1992, LETT ULTIMATECH, P7

[6] THEORY FOR LIGHT-EMISSION FROM A SCANNING TUNNELING MICROSCOPE [J].

JOHANSSON, P ;

MONREAL, R ;

APELL, P .

PHYSICAL REVIEW B, 1990, 42 (14) :9210-9213

[7]

JOHANSSON P, 1992, NATO ASI E SERIES AP

[8] SURFACE-ENHANCED RAMAN-SCATTERING - THE PRESENT STATUS [J].

MALSHUKOV, AG .

PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS, 1990, 194 (5-6) :343-349

[9] SPECTROSCOPIC MEASUREMENTS OF LIGHT EMITTED BY THE SCANNING TUNNELING MICROSCOPE [J].

SMOLYANINOV, II ;

EDELMAN, VS ;

ZAVYALOV, VV .

PHYSICS LETTERS A, 1991, 158 (6-7) :337-340

[10] LIGHT-EMISSION FROM THE TUNNELING JUNCTION OF THE SCANNING TUNNELING MICROSCOPE [J].

SMOLYANINOV, II ;

KHAIKIN, MS ;

EDELMAN, VS .

PHYSICS LETTERS A, 1990, 149 (7-8) :410-412