SECONDARY ION MASS-SPECTROMETRY - NEW ANALYTICAL TECHNIQUE FOR BIOLOGICALLY IMPORTANT COMPOUNDS

被引:114
作者
BENNINGHOVEN, A [1 ]
SICHTERMANN, W [1 ]
机构
[1] UNIV MUENSTER,INST PHYS,D-4400 MUENSTER,FED REP GER
来源
ORGANIC MASS SPECTROMETRY | 1977年 / 12卷 / 09期
关键词
D O I
10.1002/oms.1210120914
中图分类号
O62 [有机化学];
学科分类号
070303 ; 081704 ;
摘要
引用
收藏
页码:595 / 597
页数:3
相关论文
共 4 条
  • [1] DEVELOPMENTS IN SECONDARY ION MASS-SPECTROSCOPY AND APPLICATIONS TO SURFACE STUDIES
    BENNINGHOVEN, A
    [J]. SURFACE SCIENCE, 1975, 53 (DEC) : 596 - 625
  • [2] SECONDARY-ION EMISSION OF AMINO-ACIDS
    BENNINGHOVEN, A
    JASPERS, D
    SICHTERMANN, W
    [J]. APPLIED PHYSICS, 1976, 11 (01): : 35 - 39
  • [3] BENNINGHOVEN A, 1977, ADV MASS SPECTROMETR, V7
  • [4] FALES HM, 1975, ANAL CHEM, V47, P207, DOI 10.1021/ac60352a049