APPLICATION OF A PIEZOELECTRIC SCANNING FABRY-PEROT INTERFEROMETER TO STUDY OF ATOMIC LINE SOURCES .1. ASSEMBLY AND GENERAL APPLICATION OF INSTRUMENTAL SYSTEM

被引：23

作者：

KIRKBRIGHT, GF

SARGENT, M

机构：

来源：

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 1970年 / B 25卷 / 11期

关键词：

D O I：

10.1016/0584-8547(70)80056-8

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

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页码：577 / +

页数：1

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[1] BODRETSOVA AI, 1966, J APPL SPECTROSC, V4, P149
[2] RAPID MEASUREMENT OF SPECTRAL INTENSITY WITH AN OSCILLATING FABRY-PEROT SPECTROMETER - ISOTOPE ABUNDANCE IN MERCURY
BRADLEY, DJ
[J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1961, 262 (1310) : 529 - +
[3] RAPID SCANNING OF SPECTRAL LINE PROFILES USING AN OSCILLATING FABRY-PEROT INTERFEROMETER
COOPER, J
GREIG, JR
[J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1963, 40 (09): : 433 - &
[4] AN ULTRA-RAPID SCANNING FABRY-PEROT INTERFEROMETER
COOPER, J
GREIG, JR
[J]. NATURE, 1962, 195 (4839) : 371 - &
[5] SOME APPLICATIONS OF MICROWAVE-EXCITED ELECTRODELESS DISCHARGE TUBES IN ATOMIC SPECTROSCOPY
DAGNALL, RM
WEST, TS
[J]. APPLIED OPTICS, 1968, 7 (07): : 1287 - &
[6] AN INTERFEROMETRIC STUDY OF A HIGH-INTENSITY HOLLOW-CATHODE SOURCE
DAVIES, DK
[J]. JOURNAL OF APPLIED PHYSICS, 1967, 38 (12) : 4713 - &
[7] SELECTION OF MULTILAYER DIELECTRIC COATINGS FOR FABRY-PEROT INTERFEROMETRY
DAVIS, SP
[J]. APPLIED OPTICS, 1963, 2 (07): : 727 - 733
[8] RAPID SCANNING WITH FABRY-PEROT ETALON
GREIG, JR
COOPER, J
[J]. APPLIED OPTICS, 1968, 7 (11) : 2166 - +
[9] GREIG JR, 1964, THESIS LONDON U
[10] HUMAN HGC, 1969, 15 COLL SPECTR INT M