AN APPARATUS FOR HIGH-TEMPERATURE MEASUREMENT OF THERMAL DIFFUSIVITY ELECTRICAL CONDUCTIVITY AND SEEBECK COEFFICIENT

被引：7

作者：

MEDDINS, HR

PARROTT, JE

机构：

[1] University of Wales, Institute of Science and Technology, Cardiff

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1969年 / 2卷 / 05期

关键词：

D O I：

10.1088/0022-3727/2/5/307

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The apparatus enables the thermal diffusivity to be measured between room temperature and 900°C using the Ångström method, the periodic heat supply being provided by a modulated light beam. The Seebeck coefficient and electrical resistivity may be determined during the same experimental run, so, if the specific heat is known, the thermoelectric figure of merit is obtainable over the same temperature range.

引用

页码：691 / &

共 13 条

[1] THERMAL CONDUCTIVITY OF GE-SI ALLOYS AT HIGH TEMPERATURES [J].