CONTRIBUTION TO STUDY OF FLUORINE DETERMINATION ON METALLIC SURFACES BY DETECTION OF QUICK ACTING GAMMA PHOTONS

被引：11

作者：

GOLICHEFF, I

ENGELMAN.C

机构：

[1] FAC SCI ORSAY, COMMISSARIAT ENERGIE ATOM, ORSAY, FRANCE

[2] CEN SACLAY, DEPT RECH & ANAL, SERV ANAL & ETUD CHIM NUCL & ISOTOPIQUE, BP 2, GIF SUR YVETTE, FRANCE

来源：

JOURNAL OF RADIOANALYTICAL CHEMISTRY | 1973年 / 16卷 / 02期

关键词：

D O I：

10.1007/BF02514181

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：503 / 524

页数：22

共 15 条

[11] MICROANALYSIS OF LIGHT ELEMENTS BY MEANS OF (D,N) REACTIONS
MOLLER, E
NILSSON, L
STARFELT, N
[J]. NUCLEAR INSTRUMENTS & METHODS, 1967, 50 (02): : 270 - &
[12] PROTON MICROPROBE ANALYSIS OF SURFACE OF STRANDED WIRE IN LUNAR MODULE
PADAWER, GM
[J]. NUCLEAR APPLICATIONS AND TECHNOLOGY, 1970, 9 (06): : 856 - &
[13] ANALYTICAL APPLICATIONS OF A 0.5-MEV COCKROFT-WALTON SET BASED ON MEASUREMENT OF PROMPT GAMMA-RADIATION - GAMMA-RADIATION EMITTED DURING PROTON REACTIONS
PIERCE, TB
PECK, PF
CUFF, DRA
[J]. ANALYST, 1967, 92 (1092) : 143 - &
[14] SELTZER SM, 1964, NASNRC1133 PUBL, P187
[15] PASSAGE OF CHARGED PARTICLES THROUGH SILICON
SKYRME, DJ
[J]. NUCLEAR INSTRUMENTS & METHODS, 1967, 57 (01): : 61 - &