X-RAY PHOTOELECTRON-SPECTROSCOPY PEAK SHAPE-ANALYSIS FOR THE EXTRACTION OF IN-DEPTH COMPOSITION INFORMATION

被引：52

作者：

TOUGAARD, S

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1987年 / 5卷 / 04期

关键词：

D O I：

10.1116/1.574789

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：1275 / 1278

页数：4

共 19 条

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