共 13 条
[1]
A VERSATILE SPECTROMETER SYSTEM FOR SCANNING AUGER MICROSCOPY
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JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS,
1981, 14 (01)
:58-61
[2]
A SEQUENTIAL METHOD FOR REMOVING THE INELASTIC LOSS CONTRIBUTION FROM AUGER-ELECTRON SPECTROSCOPIC DATA
[J].
APPLICATIONS OF SURFACE SCIENCE,
1983, 17 (01)
:53-69
[3]
METHOD OF BACKGROUND DETERMINATION IN QUANTITATIVE AUGER-SPECTROSCOPY
[J].
APPLIED PHYSICS,
1976, 11 (03)
:233-239
[8]
LINEARIZED SECONDARY-ELECTRON CASCADES FROM SURFACES OF METALS .2. SURFACE AND SUBSURFACE SOURCES
[J].
PHYSICAL REVIEW B,
1977, 16 (04)
:1448-1458
[9]
LINEARIZED SECONDARY-ELECTRON CASCADES FROM THE SURFACE OF METALS .3. LINE-SHAPE SYNTHESIS
[J].
PHYSICAL REVIEW B,
1979, 19 (08)
:4056-4068