INSTRUMENTAL EFFECTS IN QUANTITATIVE AUGER-ELECTRON SPECTROSCOPY

被引：30

作者：

PEACOCK, DC

PRUTTON, M

ROBERTS, R

机构：

来源：

VACUUM | 1984年 / 34卷 / 05期

关键词：

D O I：

10.1016/0042-207X(84)90366-X

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：497 / 507

页数：11

共 26 条

[1]

Bishop H. E., 1973, Journal of Electron Spectroscopy and Related Phenomena, V1, P389, DOI 10.1016/0368-2048(72)80040-9

[2] DIGITAL SCANNING AUGER-ELECTRON MICROSCOPE INCORPORATING A CONCENTRIC HEMISPHERICAL ANALYZER [J].

BROWNING, R ;

BASSETT, PJ ;

ELGOMATI, MM ;

PRUTTON, M .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1977, 357 (1689) :213-+

[3] A VERSATILE SPECTROMETER SYSTEM FOR SCANNING AUGER MICROSCOPY [J].

BROWNING, R .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1981, 14 (01) :58-61

[4]

CHATTARJI D, 1976, THEORY AUGER TRANSIT, P236

[5]

DAVIS LE, 1976, HDB AUGER ELECTRON S

[6] DEGRADATION OF CONTINUOUS-CHANNEL ELECTRON MULTIPLIERS IN A LABORATORY OPERATING ENVIRONMENT [J].

FRANK, LA ;

HENDERSON, NK ;

SWISHER, RL .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (05) :685-+

[7] EFFECT OF ELECTROMAGNETIC-FIELDS ON AUGER-ELECTRON PEAK-HEIGHT RATIOS [J].

HOLLOWAY, PH ;

HOLLOWAY, DM .

SURFACE SCIENCE, 1977, 66 (02) :635-640

[8] ELECTRON MONOCHROMATOR DESIGN [J].

KUYATT, CE ;

SIMPSON, JA .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1967, 38 (01) :103-&

[9] CHANNEL ELECTRON MULTIPLIERS - PROPERTIES, DEVELOPMENT AND APPLICATIONS [J].

LECOMTE, P ;

PEREZMENDEZ, V .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1978, 25 (02) :964-973

[10]

LEGRESSUS C, 1982, SCANNING ELECTRON MI

← 1 2 3 →