A VERSATILE SPECTROMETER SYSTEM FOR SCANNING AUGER MICROSCOPY

被引：13

作者：

BROWNING, R

机构：

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1981年 / 14卷 / 01期

关键词：

D O I：

10.1088/0022-3735/14/1/016

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

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页码：58 / 61

页数：4

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[1] QUASI-ATOMIC FINE-STRUCTURE IN AUGER SPECTRA OF SOLID SILVER AND INDIUM
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PRUTTON, M
[J]. SURFACE SCIENCE, 1973, 35 (01) : 63 - 74
[2] SCANNING AUGER-ELECTRON MICROSCOPY
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PRUTTON, M
[J]. PHYSICS IN TECHNOLOGY, 1979, 10 (06): : 259 - 265
[3] INSTRUMENT RESPONSE FUNCTIONS FOR POTENTIAL MODULATION DIFFERENTIATION
HOUSTON, JE
PARK, RL
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1972, 43 (10) : 1437 - &
[4] THEORETICAL COMPARISON OF ELECTRON-ENERGY ANALYZERS DEGRADED SO AS TO OBTAIN HIGH SENSITIVITY
PRUTTON, M
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1977, 11 (02) : 197 - 204