AN AES, SAM AND RHEED STUDY OF INP(110) SUBJECTED TO ION-BOMBARDMENT AND ANNEALING TREATMENTS

被引：18

作者：

PEACOCK, DC

机构：

来源：

VACUUM | 1983年 / 33卷 / 10-1期

关键词：

D O I：

10.1016/0042-207X(83)90580-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：601 / 605

页数：5

共 26 条

[1] COMPOSITIONAL AND STRUCTURAL-CHANGES THAT ACCOMPANY THERMAL ANNEALING OF (100) SURFACES OF GAAS, INP AND GAP IN VACUUM [J].

BAYLISS, CR ;

KIRK, DL .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1976, 9 (02) :233-&

[2] EFFECT OF TEMPERATURE ON SURFACE-STRUCTURE AND STOICHIOMETRY OF (100) INP SURFACES [J].

BAYLISS, CR ;

KIRK, DL .

THIN SOLID FILMS, 1975, 29 (01) :97-106

[3] A VERSATILE SPECTROMETER SYSTEM FOR SCANNING AUGER MICROSCOPY [J].

BROWNING, R .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1981, 14 (01) :58-61

[4]

BROWNING R, 1981, I PHYS CON SER, V61, P143

[5] STUDY OF THE STRUCTURE AND PROPERTIES OF EPITAXIAL SILVER DEPOSITED BY ATOMIC-BEAM TECHNIQUES ON (001) INP [J].

CULLIS, AG ;

FARROW, FC .

THIN SOLID FILMS, 1979, 58 (01) :197-202

[6] STRUCTURAL AND ELECTRICAL-PROPERTIES OF EPITAXIAL METAL-FILMS GROWN ON ARGON ION BOMBARDED AND ANNEALED (001)INP [J].

FARROW, RFC ;

CULLIS, AG ;

GRANT, AJ ;

PATTISON, JE .

JOURNAL OF CRYSTAL GROWTH, 1978, 45 (01) :292-301

[7]

Heidenreich R.D., 1964, FUNDAMENTALS TRANSMI

[8] SOME CONSIDERATIONS OF THE LIMITATIONS OF THE AUGER-DEPTH-PROFILING TECHNIQUE AS APPLIED TO SILVER METAL AND (100) SURFACES OF INDIUM-PHOSPHIDE [J].

JONES, CJ ;

KIRK, DL .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1979, 12 (06) :837-844

[9] ELECTRON-STIMULATED OXIDATION OF INP (100) SURFACES STUDIES BY AUGER-ELECTRON SPECTROSCOPY AND BY LOW-ENERGY-LOSS SPECTROSCOPY [J].

OLIVIER, J ;

FAULCONNIER, P ;

POIRIER, R .

JOURNAL OF APPLIED PHYSICS, 1980, 51 (09) :4990-4995

[10]

PEACOCK DC, UNPUB INSTRUMENTAL E

← 1 2 3 →