REACTION OF ANIONIC AND CATIONIC SILICON CLUSTERS WITH TUNGSTEN HEXAFLUORIDE STUDIED BY FOURIER-TRANSFORM ION-CYCLOTRON RESONANCE MASS-SPECTROMETRY

被引：28

作者：

REENTS, WD

MANDICH, ML

BONDYBEY, VE

机构：

来源：

CHEMICAL PHYSICS LETTERS | 1986年 / 131卷 / 1-2期

关键词：

D O I：

10.1016/0009-2614(86)80507-3

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：1 / 7

页数：7

共 27 条

[1] EMPIRICAL-METHODS FOR DETERMINATION OF IONIZATION GAUGE RELATIVE SENSITIVITIES FOR DIFFERENT GASES [J].

BARTMESS, JE ;

GEORGIADIS, RM .

VACUUM, 1983, 33 (03) :149-153

[2] ION CYCLOTRON RESONANCE SPECTROSCOPY [J].

BEAUCHAM.JL .

ANNUAL REVIEW OF PHYSICAL CHEMISTRY, 1971, 22 :527-&

[3] PHOTOFRAGMENTATION OF MASS-RESOLVED SI-2-12(+) CLUSTERS [J].

BLOOMFIELD, LA ;

FREEMAN, RR ;

BROWN, WL .

PHYSICAL REVIEW LETTERS, 1985, 54 (20) :2246-2249

[4] SELECTIVE LOW-PRESSURE CHEMICAL VAPOR-DEPOSITION OF TUNGSTEN [J].

BROADBENT, EK ;

RAMILLER, CL .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1984, 131 (06) :1427-1433

[5] FORMATION OF WF-6(-) AND ITS DISSOCIATIVE PRODUCTS BY COLLISIONAL IONIZATION [J].

DISPERT, H ;

LACMANN, K .

CHEMICAL PHYSICS LETTERS, 1977, 45 (02) :311-315

[6] GAS-PHASE ELECTRON-TRANSFER - KINETICS OF METALLOCENE SELF-EXCHANGE REACTIONS [J].

EYLER, JR ;

RICHARDSON, DE .

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1985, 107 (21) :6130-6131

[7] ELECTRON AND FLUORIDE AFFINITIES OF TUNGSTEN HEXAFLUORIDE BY ION-CYCLOTRON RESONANCE SPECTROSCOPY [J].

GEORGE, PM ;

BEAUCHAMP, JL .

CHEMICAL PHYSICS, 1979, 36 (03) :345-351

[8] THERMOCHEMISTRY OF GASEOUS TUNGSTEN FLUORIDES [J].

HILDENBRAND, DL .

JOURNAL OF CHEMICAL PHYSICS, 1975, 62 (08) :3074-3079

[9] LASER PHOTOELECTRON SPECTROMETRY OF NEGATIVE-IONS OF SILICON AND ITS HYDRIDES [J].

KASDAN, A ;

HERBST, E ;

LINEBERGER, WC .

JOURNAL OF CHEMICAL PHYSICS, 1975, 62 (02) :541-548

[10] REACTIVITY OF IONIC SILICON CLUSTERS WITH METHYLSILANE STUDIED BY FOURIER-TRANSFORM ION-CYCLOTRON RESONANCE MASS-SPECTROMETRY [J].

MANDICH, ML ;

REENTS, WD ;

BONDYBEY, VE .

JOURNAL OF PHYSICAL CHEMISTRY, 1986, 90 (11) :2315-2319

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