SOFT ERROR RATE DEPENDENCE ON MRT FOR THIN-FILM MEDIA

被引:1
作者
ALLEGRANZA, OC
YANG, MM
机构
[1] IBM, San Jose, CA 95193
关键词
D O I
10.1109/20.333971
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A study has been conducted to determine the variation of sort error rate, SER, as a function of the product between remanent magnetization and thickness, MrT, for ti;in film media with CoPtCr magnetic layers of three different compositions. Sort error rate as well as macromagnetic characteristics of the three sets of disks were analyzed. The soft error rate, measured at linear densities varying from 90 to 130 kBPI with a magnetoresistive head, showed a minimum for MrT values ranging between 0.6 and 0.7 mcmu/cm(2), depending on the alloy used. For values of MrT smaller than the ones mentioned above, the soft error rate quickly increased for all the magnetic layers examined because of very low coercivity, while for larger values of MrT the level of degradation, due to drop In resolution and poor overwrite, varied depending on the characteristics of the him, It was also found that, at linear densities approaching 130 kBPI the log SER improved up to 5 orders when high coercivity alloys were used, while at lower linear densities it was possible to obtain smaller error rates within a certain MrT range.
引用
收藏
页码:4005 / 4007
页数:3
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