ATOM-SURFACE AND RADICAL-SURFACE STICKING COEFFICIENTS MEASURED USING RESONANCE-ENHANCED MULTIPHOTON IONIZATION

被引：32

作者：

ROBERTSON, RM

ROSSI, MJ

机构：

来源：

JOURNAL OF CHEMICAL PHYSICS | 1989年 / 91卷 / 08期

关键词：

D O I：

10.1063/1.457620

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：5037 / 5049

页数：13

共 31 条

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